The Ohio State Nanotech West Lab has ordered an advanced silicon drift detector (SDD) for our Carl Zeiss SMT Ultra 55 Plus(R) field-emission scanning microscope (FESEM, tool ID SEM02). The instrument will arrive sometime in the month of December installation. Availability of the detector and training on its use will be announced to the SEM listserv.
Silicon drift detectors are fast, sensitive, modern X-ray detectors for materials analysis (Wikipedia has an informative writeup on them, for those who are interested). Ours will bring a scanning materials analysis capability to SEM02, which is located in Bay 2 of the Nanotech West cleanroom.
At roughly the same time we also placed an order for a glovebox, which will streamline our abilility to change/charge materials precursors for our Picosun atomic layer deposition (ALD) tool.
Both purchases were enabled by capital funds of the Ohio Wright Center for Photovoltaics Innovation and Commercialization, PVIC (www.pvic.org). PVIC is funded by the Ohio Department of Development through the Third Frontier Program, and is administered at its Ohio State node by the OSU Institute for Materials Research (IMR).
Robert J. Davis, Ph.D.
Director, OSU Nanotech West Lab
Co-Director, PVIC / Associate Director, IMR